Innovative compression algorithms can improve today�s high-speed data sampling. Compression algorithms have enabled many popular applications over the years. We cannot imagine sending e-mail ...

Compression testing is used to determine how a product or material reacts when it is compressed, squashed, crushed or flattened by measuring fundamental parameters that determine the specimen behavior ...

Scan technology is essential for testing the digital content of large-volume devices. By using scan, you can make the device itself responsible for some of the “test” chores, and you can shorten the ...

The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Until the mid-1970s, compression testing of composite materials received relatively little attention. Up to that point it, had generally been assumed that the compressive stiffness was approximately ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...