As the new manufacturing engineer for the stapler production line, you find yourself shifting through quality data to get a better understanding of the defect rates involved. One of the reasons you ...

The 30% Risk Spike: AI-generated code in "unhealthy" parts of the codebases leads to higher defect rates. The Context Gap: AI ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

(Editor's Note: This is the first of a series of articles that will define what is predicted yield improvement and how it can be measured or validated using test data) Design for Yield (DFY) tools are ...

Have you ever seen a salesperson boast about meeting their revenue targets without caring about whether the sale was profitable? Have your kids proudly showed you an A on their geometry test and ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. This article dives into the happens-before ...