Integrated power-management ICs are often used in high-power systems such as RADAR and satellites. These lightweight devices can replace older modules and provide better power efficiency. But, failure ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

ICs for automotive applications must satisfy long-term reliability requirements by being insensitive to hard electromechanical stresses. Recently, some studies revealed that the long term robustness ...

Improved testability, coupled with more tests at more insertion points, are emerging as key strategies for creating reliable, heterogeneous 2.5D and 3D designs with sufficient yield. “With chiplets, ...