In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
A research team has introduced a lightweight artificial intelligence method that accurately identifies wheat growth stages ...
(a) An illustrative map for Crack-Net, including the initial features, looping solver for data generation, model training, and prediction performance. (b) The Crack-Net architecture, which utilizes ...
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